Fields · Engineering · Electrical and Electronic Engineering

Integrated Circuits and Semiconductor Failure Analysis

This cluster of papers focuses on advanced techniques and methodologies for failure analysis of integrated circuits. It covers a wide range of topics including photon emission microscopy, laser voltage probing, backside analysis, nanoprobing, fault localization, time-resolved imaging, and electrical characterization. The papers explore innovative approaches to identify and analyze failures in CMOS circuits and other semiconductor devices.